穨良導絡值與驗診壓力之關聯研究

Size: px

Start display at page:

Download "穨良導絡值與驗診壓力之關聯研究"

璨古
7 years ago
Views:

1 Study for the Effect of Applied Diagnosis Pressure to Ryodoraku Acupuncture Readings

2 Study for the Effect of Applied Diagnosis Pressure to Ryodoraku Acupuncture Readings

3 I

4 II

5 Abstract Ryodoraku Acupuncture is the most common application of medical appliances in traditional Chinese medical theory. In some of the hospitals, the department of traditional Chinese medicine and family medicine used the Ryodoraku Acupuncture to be the auxiliary medical instruments. It is known that theory of meridians was existed in China for several thousands years. These specific points were stood for meridian acupuncture points. These points almost are lie in the tip of limbs as like finesse and ankle. Through the inspected results, the Rryodoraku Acupuncture has most probably degree of accuracy. However the important factor of accuracy depend on experience of users, or relative importance of inspective technique, and accurate of acupuncture points. For this reason, users must be disciplined to get up to high accuracy and physiological function by correct determining. The purpose of this study is to find out the potential technique of increasing the inspecting accuracy. Firstly the probe structure was modified for experimental need. A Strain gage was utilized and stuck on the experimental structure. The experiments were conducted to realize that how applied pressure upon the strain gage affect the measurements of Ryodoraku Acupuncture readings. The results show significant variance once applied pressure is varied during the process of Ryodoraku Acupuncture. III

6 IV

7 / V

8 A. B. C I / V AT-MIO-16F VI

9 Plot 0,Plot 1 22 VII

10 AT-MIO-16F VIII

11 1.1 [1] Strain gages

12 1.3 2

13 2.1 ;

14 [1] 2.3 Ohm s Law I V R 12V 200 A A [2] 2.1 4

15 2.4 sympathetic nervous system parasympathetic nervous system [3] 5

16 2.5 Heads Zones. Head, Sir Henry,

17 [4]

18 8 methylene blue 1 = π 2.1 ( ) = π 2.2

19 Energy 2.5 9

21 [5]

22 3.1 Strain gages 3.1 A L 0 A B L0 L R = ( R0 R) ( ) 3.1 A + A C L0 + L R = ( R0 + R) ( ) 3.2 A A 0 [6] 3.1 A. B. C. 12

23 KYOWA Strain GAGES Type Temperature Compensation For Gage Length Gage Resistance RH Gage Factor Adoptable Thermal Expansion Thermal Output Temperature Coefficient Of Gage factor KFC-1-D19-11 Steel PPm/ 1.8 / / [7] 3.2 I 2 R R A R B 70~80 100Hz fc 1 = 3.3 2π R1C1R2C2 13

24 R 1 R 2 C 1 C 2 fc = 1 2πR 1C / / 3.3 v o R1 + R2 = Iin R 3.5 R1 R1 + R2 = 100 R1 v o =100 Iin R 3.6 f C =100Hz 200 A R 100 4V [8] 14

25 3.3 I / V National Instrument AT-MIO-16F-5 I/O 3.4 AT-MIO-16F-5 CB AI GND ACH0 ACH1 ACH2 ACH3 ACH4 ACH5 AI SENSE DAC1 OUT AO GND ADIO0 ADIO1 ADIO2 ADIO3 DIG GND +5V EXTSTROBE* EXTGATE* SOURCE 1 OUT1 GATE2 SOURCE5 OUT5 AT-MIO-16F AI GND ACH8 ACH9 ACH10 ACH11 ACH12 ACH13 ACH14 ACH15 DAC0 OUT EXTREF DIG GND BDIO0 BDIO1 BDIO2 BDIO3 +5V SCANCLK EXTTRIG* EXTCONV* EXTDACUPDATE* OUT2 GATE5 FOUT 3.4 AT-MIO-16F-5 15

26 3.2 AT-MIO-16F-5 Pins Signal Names Descriptions 1,2 AIGND Analog Input Ground 3 through 18 ACH0 through ACH15 Analog Input Channels 0 through AI SENSE Analog Input Sense 20 DAC0 OUT Analog Channel 0 Output 21 DAC1 OUT Analog Channel 1 Output 22 EXTREF External Reference 23 AOGND Analog Output Ground 24,33 DIG GND Digital Groung 25,27,29,31 ADIO0 through ADIO3 Digital I/O port A signals 26,28,30,32 BDIO0 through BDIO3 Digital I/O port B signals 34,35 +5V +5 VDC Source 36 SCAN CLK Scan Clock 37 EXTSTROBE* External Strobe 38 EXTTRIG* External Trigger 39 EXTGATE* External Gate 40 EXTCONV* External Convert 41 SOURCE1 From the Am9513A Counter 1 Signal. 42 GATE1 From the Am9513A Counter 1 Signal. 43 OUT1 From the Am9513A Counter 1 Signal. 44 EXTDACUPDATE* External DAC Update 45 GATE2 From the Am9513A Counter 2 Signal. 46 OUT2 From the Am9513A Counter 2 Signal. 47 SOURCE5 From the Am9513A Counter 5 Signal. 48 GATE5 From the Am9513A Counter 5 Signal. 49 OUT5 From the Am9513A Counter 5 Signal. 50 FOUT From the Am9513A FOUT Signal. 3.3 LabVIEW DAQ LabVIEW 16

27 3.5 [9,10] National Instrument 17

28 AT-MIO-16F-5 CARD A Strain Gages [11] 18

29 A A Labview Plot 0 Plot

31 4.6 Plot 0 Plot 1 I/V 100 Plot0 10 Av = V o ( AV = 200) = I in Plot 0 V Plot Av = mv Plot 1 V 100 V o ( AV = 200) 10 A 6 = I in

32 Plot 0,Plot 1 Y A Y 10-2 mv

34 [1] 1985 [2] 1986 [3] 1995 [4] 1985 [5] 1998 [6]Humphries Sheets, Industrial Electronics,1999. [7] IC 1993 [8] OP Amp 1998 [9] Labview 1999 [10] Labview 1998 [11]Joseph J.Carr, Sensors and Circuits,

穨ecr2_c.PDF

穨ecr2_c.PDF i ii iii iv v vi vii viii 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 1 26 27 2 28 29 30 31 32 33 34 35 36 37 38 39 40 3 4 41 42 43 5 44 45 46 6 47 48 49 50 51 52 1 53 2 54 55 3 56

穨良導絡值與驗診壓力之關聯研究

穨良導絡值與驗診壓力之關聯研究