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( 3) - 3 International Classification Current US Classification Semiconductor devices with measuring or testing ( ) IPC = H01L 21/66 or G01R 31/26 : Semiconductor devices with USPC = 438/14, 438/15,438/16, 438/17 or 438/18 measuring or testing International Class. = G01R 31/26 or H01L 21/66 IPC H01L021/66 Current US Class. = 438/14~18 0 31 32-3 ( 1) Quick search - 3 ( 1) Advanced search 33 34 AND, OR, ANDNOT Two-term Boolean Expressions Nested Boolean Expressions 35 36
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