X Press 2013 X Press Epsilon 1 X 9 (IYCr2014) X Press UNESCO X Press 3 IMP Herzog LKAB CNA 3 5 2014 Peter van Velzen X 9 Epsilon 1 - EDXRF 6 7 CNA 5 8

2013 4 IMP UCM CNA 3 4 5 X

X Press 2013 X Press Epsilon 1 X 9 (IYCr2014) X Press UNESCO X Press 3 IMP Herzog LKAB CNA 3 5 2014 Peter van Velzen X 9 Epsilon 1 - EDXRF 6 7 CNA 5 8 BCEIA 2013 10 IMP 3 2013 10 UCM 4 (IYCr2014) 11 11 2

IMP 50 Lang Hancock Gina Rinehart Hancock Prospecting 100 IMP XRF IMP XRF Axios IMP Herzog 3 Axios FAST Axios max 2 Axios max 344 5 115 277 20 5500 344 XRF IMP 1,272 3

UCM (UCM) 2 X (XRD) UCM (Centros de Asistencia a la Investigación - CAI) XRD/XRF CAI X Pert MPD X Pert MRD X Pert PRO Alpha-1 X Pert PRO MPD SAXS XRF (Axios 4 kw) 2013 10 X Pert Powder Empyrean UCM UPM XRD/XRF (PDF) 2D 1293 5 20 1499 Complutum 1836 Universidad Central de Madrid UCM 85,000 9,500 6000 Emilio Matesanz X'Pert Powder Empyrean XRD Julián Velázquez Ignacio Carabias Emilio Matesanz (from right to left) XRD/XRF CAI CAI 4

CNA LKAB (Luossavaara-Kiirunavaara AB) LKAB CNA - CNA³ CNA³ Sodern Sodern PFTNA CNA 3 CNA 3 CNA 3 LKAB CNA 3 800 CNA 3 CNA 3 CNA 3 Sodern CNA 3 LKAB 5

Epsilon 1 XRF Epsilon 1 BCEIA (FEM) Epsilon 1 XRF SDD XRF Epsilon 3 Epsilon 3 XL Epsilon 1 X Epsilon 1 100 / Epsilon 1 ASTM D6481 Epsilon 1 AAS ICP Epsilon 1 Epsilon 1 X XRF X CPU 120 GB X 50 kv X 6

Epsilon 1 ASTM D4294 ISO 20847 ISO 8754 IP 496 X (EDXRF) EDXRF Epsilon 1 ASTM D4294 Epsilon 1 Epsilon 1 X Epsilon 1 Omnian Omnian Epsilon 1 0.15 7

Tellus Border Tellus 12,300 X 4,400 Tellus Border INTERREG IVA (SEUPB) Axios max Axios max -Advanced X (WDXRF) Epsilon 5 X (EDXRF) 52 2011 8 2012 6 150 µm 53 µm 12 ArcGIS www.tellusborder.eu XRF 8

X Bill Betterton XRD (NIST) 1,2 RockJock RockJock XRD 3 X Pert PRO MPD XRD 1 USGS 4 5 2 Bill 10 (110) 28 (310) 1a 1b 1c Bill (90%) / / Rietveld Bill Betterton 32 mm PW1817/32 0.7 2θ USGS info@panalytical.com 2 1. X X Preparation of Specimens for X-ray Fluorescence and X-ray Diffraction Analysis Buhrke Victor E. Jenkins Ron Smith, Deane K. 1998 John Wiley & Sons, Inc. 148 2. Jenkins Ron Snyder Robert L. X Introduction to X-ray Powder Diffractometry 138 1996 John Wiley & Sons, Inc. NY 247-249 3. www.minsocam.org/msa/software 9

2013 9 24 26 64 Axios max WDXRF XRD Empyrean PIXcel 3D 2 2 EDXRF Epsilon 3 XL Eagon 2 Omnian HighScore (Plus) 2015 BCEIA 2013 10 23 26 15 (BCEIA) 2013 8 Epsilon 1 X Pert 3 Epsilon 3 FingerPrint Harald van Weeren ScatterX 78 Epsilon 3 10

(IYCr2014) 2013 3 X Press 2014 (IYCr2014) IYCr2014 X X IYCr2014 www.panalytical.com/iycr2014 DNA 5 Men s Sheds Men s Sheds 1996 Men s Sheds 850 Men s Sheds Men s Sheds 11

2014 1 1 28 30 1 27 31 2 7 9 IFEX 2014 2 9 13 AXAA 2014 2 23 26 SME 3 2 6 Pittcon 3 17 20 ArabLab 2014 3 26 28 VII Expominas 4 21 25 www.panalytical.com/events PANalytical B.V. Lelyweg 1, 7602 EA PO Box 13, 7600 AA Almelo The Netherlands +31 (0) 546 534 386 +31 (0) 546 534 598 info@panalytical.com www.panalytical.com +86 10 5993 5870/1 +86 10 5993 5878 +86 21 6113 3701/2 +31 546 834 969 XRD XRD Marco Sommariva 2013 GISAXS Highscore (Plus) X USP <232> X ScatterX 78 SAXS/ WAXS www.panalytical.com/webinars info.china@panalytical.com www.panalytical.com www.panalytical.com.cn ( ) 50% www.fsc.org MIX Paper from responsible sources FSC C112051 12