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阿熏普梅
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1 高速光通讯测试泰克科技 ( 中国 ) 有限公司

2 主题采样示波器基础及应用光信号测试的项目以及要点如何改善光信号测试的精度, 一致性以及重复性泰克 10G/25G/40G/100G 的测试方案高速信号源和误码仪在光通信中的应用 /12/14 高速光通讯测试

3 采样示波器基础 : 采样示波器的特点高带宽目前, 泰克 DSA8300 示波器的带宽高达 80G+ 高等效采样率泰克 DSA8300 示波器等效采样率高达 1000T 以上高垂直电压分辨率泰克 DSA8300 示波器的 ADC 分辨率为 16bit 低触发抖动泰克 DSA8300 触发抖动低至 100fs 以下低本底噪声泰克 80Exx 噪声低至 300uV(RMS) /12/14 高速光通讯测试

voltage 采样示波器采样原理 : 需要同步触发信号, 多次触发完成捕获 time Data Mask test Eye patterns are the common result of clock-triggering in Equivalent time sampling: vectors are not drawn since adjacent samples can jump

4 voltage 采样示波器采样原理 : 需要同步触发信号, 多次触发完成捕获 time Data Mask test Eye patterns are the common result of clock-triggering in Equivalent time sampling: vectors are not drawn since adjacent samples can jump from logical 1 to 0 frequently Clock Precision variable delay A clock trigger can be usersupplied or recovered from the data to trigger the equivalent time sampler When a clock signal is used to trigger the equivalent-time 8300 scope the sampled DATA signals generally create EYE PATTERNS (between clock triggers the sampled DATA could be either a logical 1 or 0) /12/14 高速光通讯测试

5 采样示波器的优势及应用带宽高达 80GHz 以上进行高速的周期脉冲测试进行高速的串行数据分析噪声低高垂直分辨率 (16bit) 进行高速的眼图测试以及噪声分析超低的触发抖动 ( 使用 82A04B 的模块使触发抖动减少至 100fs) 进行高速的串行数据抖动分析 /12/14 高速光通讯测试

6 光通信基础知识介绍 - 常用光波长目前, 按照光信号在光纤中的传播方式有单模与多模之分 ; 其波长也不一样主流的波长有 nm 单模 :9um 光纤直径, 波长多为 nm 多模 :62.5um 光纤直径, 波长多为 nm /12/14 高速光通讯测试

7 Optical standard Standard Line Rate OC-3/STM-1 OC-12/STM-4 FC1063 ENET1250 FC2125 OC48//STM48, GBE, INF2500 FEC2.666!0GBASE-X4, FC3188 FC4250 INF5000 OBSAI6144 CPRI Mb/s 622 Mb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s Gb/s FC8500*8, OC-192/STM-64, 8GFC, 10GBASE-W, 10GBASE-R, 40GBASE-R4, 100GBASE-R10, 10GFC, FEC10.66, FEC10.71, FEC11.10, FC , 9.95,10.31, 10.51,10.66,10.71,11.1, 11.3 Gb/s ORR Filters plus Unfiltered bandwidth path (typically 12 GHz) 100GBase-LR4, 100GBase-ER4 Infiniband EDR (LW) 100GBase-LR4 + FEC, 100GBase-ER4 + FEC 40GBase-FR OC-768 / STM-256, VSR-2000 OTU3 (OC G.709 FEC), VSR-2000, 4x10G LAN-PHY (OTU3) 4 x Gb/s 4 x Gb/s Gb/s Gb/s Gb/s Gb/s /12/14 高速光通讯测试

8 NRZ 和 RZ 两种编码的眼图比较 NRZ 编码眼图, 高功率电平为逻辑 1, 低功率电平为逻辑 0, 在两高低两阶跳变 RZ 编码眼图, 底部有一根线为逻辑 0, 逻辑 1 显示为脉冲 /12/14 高速光通讯测试

9 使用 Tektronix DSA8300 能完成什么测试? 核心测试眼图测试抖动测试幅度域平均光功率 (AOP) 消光比 (ER) 光调制幅度 (OMA) /12/14 高速光通讯测试

10 使用 Tektronix DSA8300 需要那些配置? 核心测试光采样模块 ( 滤波器 ) 带有 4 阶 Besel-Thomson 低通滤波器, 且滤波器的带宽为 DUT 数据率的 0.75 倍时钟恢复单元 / 模块 (CRU) 可以恢复 DUT 数据率相对应的时钟, 且该 CRU 具有带宽为 DUT 数据率 1/1667 的低通滤波器 /12/14 高速光通讯测试

11 光接口物理层测试的几项要求对时钟恢复 CDR 的要求对噪声, 灵敏度的要求对滤波器的要求对波长的要求对抖动的要求 ( 最新的 40G/100Gbps 的标准 ) /12/14 高速光通讯测试

12 光接口物理层测试 : 对 CRU 的要求时钟内嵌于光信号中传输 Tx + + path + + Rcv CDR DATA DATA CLOCK 要求 CDR 的环路带宽为 Data rate/1667 在接收端使用 CDR 电路将时钟恢复出来 /12/14 高速光通讯测试

13 光接口物理层测试 : 对 CRU 的要求 /12/14 高速光通讯测试

14 光接口物理层测试 : 噪声 / 灵敏度要求在测试小功率光模块或者超长波长光模块时,DUT 的光功率会很小所以模块的噪声必须很低, 灵敏度很高, 达到一定的信噪比, 测试的结果才能准确, 而显示出来的信号噪声是真正属于信号的, 而不是模块自身的噪声 /12/14 高速光通讯测试

15 光接口物理层测试 : 对滤波器的要求测试眼图模板时, 需要使用 Optical Reference Receiver 光参考接收器 (O/E + Filter), 信号首先经光电转换, 然后经 4th Order Bessel-Thomson 滤波器过滤, 按业界规范要求, 此滤波器的带宽要是被测信号速率的 0.75 倍业界测试光接口所使用的 4th Order Bessel-Thosom 滤波器的频响如下 : 不一样的速率, 有不一样的滤波器要求 /12/14 高速光通讯测试

16 光接口物理层测试 : 对波长的要求目前, 按照光信号在光纤中的传播方式有单模与多模之分 ; 其波长也不一样主流的波长有 nm 单模 :9um 光纤直径, 波长多为 nm 多模 :62.5um 光纤直径, 波长多为 nm /12/14 高速光通讯测试

17 光通信中的性能参数 :OMA 与 ER 逻辑 1 和逻辑 0: 光功率高的状态是逻辑 1, 反之则为逻辑 0. 光功率常用 :dbm = 10log(Power(mW)/1(mW)) OMA:Optical Modulation Amplitude 逻辑 1 和逻辑 0 光功率差 : OMA=P1-P0 有时也定义成 : P1 1 OMA 2P P0 average P1 1 P0 P1 P0 Paverage 2 ER:Extinction Ratio, 消光比 P1 ER, db 10log P0 P P /12/14 高速光通讯测试

18 光通信中的性能参数 :OMA 与 ER /12/14 高速光通讯测试

19 消光比测试 - 光接口测试的最大难点工业标准对消光比的描述 (ER) 什么是消光比 (ER) 消光比的重要性影响消光比测试精度和可重复性的因素泰克 DSA8300 提高消光比测量的解决方案 - ER Calibrated 标准消光比测量和经过 ER Calibrated 消光比测量结果比较 /12/14 高速光通讯测试

20 消光比的定义 ER (Extinction Ratio) 为光模块发射逻辑 1 时的平均光功率和发送逻辑 0 时的平均光功率之比. 在光眼图的中心的 20% 的位置测量直方图的平均值 Logic level 1 Center 20% of the Eye Histogram Logic level 0 P1 ER, db 10log P0 P P ER 测量结果与逻辑 0 时电平和暗电平的相对值有很多影响 ( 当激光器完全关闭不发光时 ) 很小的 0 电平的变换 / 偏离都会明显的影响消光比的测试结果 /12/14 高速光通讯测试

21 为什么消光比测量结果非常重要? 标准规范中规定了消光比的性能指标以确保网络的互通性 ; 所以对这一领域的各个提供商来说满足规范要求极为重要. 除满足规范要求外还有其他各原因也突显消光比测量的重要性 : 不同的元器件, 模块和系统有不同的设计裕量良好的消光比性能可以改善误码率, 是考量总体性能和质量的关键测量项目消光比测量值的波动直接影响产品的一次通过率, 减小产出率和收益当验货检查结果和提供商不一致时使得工作复杂化 /12/14 Tektronix 高速光通讯测试 V1.10

22 Penalty [db] 消光比应该在什么范围之内呢? ER 可以说明有多少光被浪费 ( 相对暗电平的偏置的光功率没有承载任何信息 ) BER Penalty caused be ER 10 在 ER 小于 5dB 后光功率损耗急剧加大, 也就是说额外还需要光功率如果 ER 大于 15 或是 18, 对此性能影响非常小 ER [db] 当 ER > 15dB 时对 BER 的改善非常小 That s why standards don t ask for 20 db of ER And, that is why the precision of ER measurements is not critical beyond ER > 15 db /12/14 Tektronix 高速光通讯测试 V1.10

23 第一类误差来源 : 直流偏置校准 (Dark Cal) 垂直偏置中的误差会导致相当大的 ER 误差 * 适当的暗电平电平校准和进行补偿过的光模块测试激光眼图的结果为逻辑 1 电平 200uW 逻辑 0 电平 7uW (ER = 28.6-to-1 or db). * 如果在相同的测试中包含 +2uW 的偏置误差, 那么逻辑 1 电平 202uW 逻辑 0 电平 ; 9uW (ER = 22.4-to-1 or db). 22% 的线性变化, ( 或 db 差别 ) 光模块中的偏置随着温度而变化 *( 即使是很小的温度的改变, 也需要运行暗电平校准或补偿 ) /12/14 Tektronix 高速光通讯测试 V1.10

24 第二类误差来源 - 影响消光比测量精度的其他原因 4 阶 BT 频响在不同频段存在的偏差中高频段范围低频失真 (near DC; finite settling time dribble-up ) 群延迟采样器的低频响应 A/D 的非线性失真采样示波器模块结构影响 : 滤波器的射频开关引入损耗和失真, 尤其在高频段无法通过暗电平校准消除这类误差影响一般都被忽略在某些光采样示波器中没有直接或是间接的对这一指标进行说明 DUT 的一些特性有可能激化这类误差 /12/14 Tektronix 高速光通讯测试 V1.10

25 泰克的解决方案 : 准确可重复的消光比测量生成消除第二类误差来源的校准因子通过专门的高精度消光比校准源提供校准在工厂完成校准过程并将参数存于模块内通过 ER Calibrated 测试项提供校准测试结果 ( 同时保留旧的测试项目 ) 能同时提供绝对精度和可重复性测试指标 /12/14 Tektronix 高速光通讯测试 V1.10

No. of units 标准消光比和经过校准的消光比测量值分布比较 -DML( 直接调制激光器 ) 18 16 14 12 10 8 6 4 2 Raw ER DML at 10.7Gb/s Corrected ER DML Module with ER of >10 db.

26 No. of units 标准消光比和经过校准的消光比测量值分布比较 -DML( 直接调制激光器 ) Raw ER DML at 10.7Gb/s Corrected ER DML Module with ER of >10 db. Typical ER measurement distribution 9.2 to 11.2 db ER Calibrated measurement distribution db ER (db) /12/14 Tektronix 高速光通讯测试 V1.10

27 ER (db) ER uncertainty range (db) 消光比校准后的规格 - 测试重复性提供业内最优的消光比可重复性测试经过 ER Calibrated 典型的重复度可达 : +/- 0.6 % (-0.25dB / +0.27dB at 10 db ) db ER repetability db ER repeatability deviation 重复测试值重复测试偏离度 center ER (db) -4-5 center ER (db) 理想值理想值 /12/14 Tektronix 高速光通讯测试 V1.10

28 ER (db) ER uncertainty range (db) 消光比校准后的规格 - 测试精度业内唯一可以提供高精度经过校准的消光比测试经过 ER Calibrated 绝对精度可以达到 : +/- 1.2 % (-0.49dB /+0. 56dB at 10 db) db ER absolute accuracy db ER absolute deviation 实际测试值与理想值的偏离度 center ER (db) -4-5 center ER (db) 理想值理想值 /12/14 Tektronix 高速光通讯测试 V1.11

未较准消光比和经过校准的消光比测量值分布比较 You manufacture modules with ER >5.4 db and <6dB. 低成本 VCSEL ( 垂直腔面发射激光器 ) in a TOSA ( 光发射次模块 ) 5.4 6.

29 未较准消光比和经过校准的消光比测量值分布比较 You manufacture modules with ER >5.4 db and <6dB. 低成本 VCSEL ( 垂直腔面发射激光器 ) in a TOSA ( 光发射次模块 ) With the You measure your DSA8300 modules with ER many And scopes But your you and customer are get really a typical sees Calibrated shipping this: this: distribution everyone and has rework the rejects. this! Reject Reject /12/14 Tektronix 高速光通讯测试 V1.10

30 泰克的解决方案 : 准确可重复的消光比测量 ( 免费标配功能 ) 去除影响消光比精度的第二类误差源, 改进测试的可重复性和测试精度通过专门的校准信号源和验证信号源保证校准结果对于制造企业来说这意味着 : 更好的产出比, 或更长的传输距离, 或更多的裕量对器件和模块以及模块使用者来说意味着质量和一致性验证更清晰使用 DSA8300 的 ER Calibrated 增加你竞争力 /12/14 Tektronix 高速光通讯测试 V1.10

31 Measurement Challenges Instrumentation Jitter Instrumentation jitter has two major components random jitter and deterministic jitter. Random jitter when characterizing high performance devices, having the lowest possible instrumentation jitter is critical. Shown below is the amount of instrumentation jitter that would consume 5% of the user s jitter budget at the various standard data rates. Random Jitter Standard Bit Rate (Gb/s) Unit Interval ) 16G Fibre Channel psec 250 fsec PCIe psec 225 fsec 100GBASE-R psec 140 fsec SONET OTU psec 129 fsec (CEI-28G-SR) 40GBASE-FR psec 86 fsec Deterministic Jitter while there are many sources of deterministic jitter, a common source is data dependent jitter which is a strong function of the connection from the DUT to the instrumentation system. Minimizing this interconnect reduces the total instrumentation jitter. 3 3 September 2012 PS207 v0.9

Ultra low jitter floor - Clock signal acquired with 82A04B Phase Ref 10.

32 Ultra low jitter floor - Clock signal acquired with 82A04B Phase Ref GHz 1.3 V Data Input: 650 mv Jitter: 75 fsec 3 4 September 2012 PS207 v0.9

Ultra low jitter floor - Clock signal acquired with 82A04B Phase Ref 25.

33 Ultra low jitter floor - Clock signal acquired with 82A04B Phase Ref GHz 430 mv Data Input: 215 mv Jitter: 83 fsec 3 5 September 2012 PS207 v0.9

34 DSA8300 Digital Serial Analyzer DSA8300 Optical Module Portfolio Multi-mode, Broad Wavelength ( nm) Modules 80C07B Supports rates to 2.7 Gb/s, high sensitivity, optional integrated clock recovery 80C08D 80C12B 80C14 New Supports all of the 8/10 Gb/s applications, high sensitivity, optional integrated clock recovery, optional Integrated CR Supports rates from 155 Mb/s 11.3 Gb/s, high sensitivity - data pick-off for external CRU e.g. CR125A Supports rates from 8.5 Gb/s Gb/s, high sensitivity data pick-off for external CRU e.g. CR175A Single-mode, Long Wavelength ( nm) Modules 80C11B 80C10C New New Optical bandwidth to 30GHz, supports 10G bits up to14g+ standards, optional integrated CR Optical bandwidth to 80GHz, supports all 40 and 100 Gb/s (4 x 25 Gb/s) standards, optional CR trigger pickoff for e.g. CR286A CRU, optional high sensitivity photo-receiver for use with external equipment (e.g. for optical BER testing with BERTScope) 30 July 2012, v W

35 NEW 80C10C Up to 80 GHz Optical bandwidth Industry s best noise 25G, 40G and beyond Best signal fidelity, better mask margin and first pass yields Versatility: 80C10C, Option F1 The ONLY single module solution to 100GbE (4x25), OC768, G.709 FEC, OTU3, OTU4 ( Gb/s), and 40GbE in a single module Value: 80C10C Focus Solutions: Option F2 100GbE (4x25) ONLY compliance test solution Performance: 80C10C, Option F3 40 GbE compliance test 80 GHz Optical bandwidth, industry s leading NEW 80C10C Options F1, F2, and F3 Industry Leading, Versatility, Value, and Performance Connectivity options for a complete calibrate system solution Option CRTP Clock Recovery Trigger Pickoff provides Data and Data_ outputs for connectivity to CRU and / or BERTScope (high optical amplitude required for BERTScope) Option HSPR High-Sensitivity Photo Receiver provides independent optical input and electrical outputs that can be used with CRU and / or BERTScope or other equipment 37

36 80C10C, Option F1, F2, and F3 Configurations Next Generation Of Optical Test Optical Bandwidth / Integrated ORR Versatility Value Performance Tektronix 80C10B Opt. F1 1 Tektronix 80C10B Opt. F2 1 Tektronix 80C10C Opt. F3 1 - Max. bandwidth 70 GHz 55 GHz 80 GHz - Selectable bandwidths - 65 & 30 GHz 40Gbs G.709 FEC Telecomm GHz & 44.5 GHz - 40GbE Datacom GHz - OC GHz Telecom GHz - 100GbE-4X FEC Datacom GHz - 100GbE-4X Datacom GHz - Clock Recovery Trigger Pickoff, Option CRTP 2 Available Available Available High-Sensitivity Photo Receiver, Option HSPR 2 Available Available Available 1 Customer must select one from Options F1, F2, or F3 2 Option CRTP and HSPR are mutually exclusive both cannot be ordered in the same 80C10C module. 38

37 10*log(V f /V dc ) (db) fr=0.75*39.813ghz Reference Receiver Repeatability 39.8Gbps C10 Heterodyne Frequency Responses OC768 RR setting test unit #1 test unit #2 test unit #3 test unit #4 test unit #5 test unit #6 test unit #7 test unit #8 test unit #9 test unit #10 test unit #11 test unit #12 test unit #13 test unit #14 upper tolerance ideal nominal lower tolerance previous upper tol. previous lower tol Frequency (GHz) /12/14 高速光通讯测试

38 Superior 40 Gbps Reference Receiver Performance Traditional ITU Filtering Methodology /12/14 高速光通讯测试

39 Superior 40 Gbps Reference Receiver Performance Tektronix Proprietary Filterless Design /12/14 高速光通讯测试

40 New 80C10C Optical Module Unmatched Sensitivity for 100G (4 x 25G) Applications OTU4 transceiver: 3.5 dbm, 1310nm, Gb/s, 9µm SMF New Tektronix 80C10C Alternative Solution 30 July 2012, v W

41 40Gb/s NRZ Eye Diagram(testing at customer side) /12/14 高速光通讯测试

42 80C14 Optical Module 16GFC Single/Multi-mode Solution 80C14 Optical Module Performance Specifications Single and multi-mode Supported wavelengths Maximum Optical Bandwidth Optical Reference Receivers Sensitivity Buffered electrical data pick-off to support external clock recovery instrument 9, 50, 62.5 m core nm 14 GHz All 10 Gb/s standards + 8 and 16 GFC -12 dbm at 850nm (-15 dbm at 1310 nm) Recommended Tektronix CR175A or CR286A Standards Supported Standard Data Rate 8 GFC (old) Gb/s OC192/STM Gb/s 10GBase-W Gb/s 10GBase-R Gb/s 40GBase-LR Gb/s 10G EPON Gb/s 100GBase-SR Gb/s 10GFC Gb/s G.975 FEC Gb/s G.709 FEC Gb/s 10GBE FEC Gb/s 10 GFC FEC Gb/s 12.5 Gb/s FEC Gb/s 16 GFC Gb/s Infiniband FDR Gb/s

43 New 80CXX Optical Module Unmatched Sensitivity for 16G FibreChannel 16GFC SW transceiver: -11dBm, 850nm,14.025Gb/s, 50um MMF New Tektronix 80C14 Alternative Solution Jan. 2011, v. 0.03

44 Mask Test Results 80C14 Has More Mask Margin Tektronix mask has better margin: 33% vs. 17% The power level is above the minimum allowed by the 16GFC standard. A significantly higher power level would lead to a decrease in mask margin difference D Tek 80C14 46

due to old CPU and new product would not exhibit this slow-down. The video on the right doesn t exhibit noticeable slow-down.

45 Mask test Speed was measured w/o the Remote Desktop resp. VNC ; what is shown in the video on the left is 1 to 2 s slower than measured value (shown on the caption) due to VNC, presumably this problem is due to old CPU and new product would not exhibit this slow-down. The video on the right doesn t exhibit noticeable slow-down. Tek oscilloscope: the Samples counted are really the whole screen; to achieve true 1MS in the mask area the acquisition was set to an increased value of 1.54 MS Run Done: 1MSamples in 32 s Run Done: 1MSsamples in 11.7 s TITL E DATE DCAj 47 Tek DSA8300

46 80C12B Optical Module Tributary and 10G Rate, Single/Multi-mode Solution 80C12B Performance Specifications Single and multi-mode (9, 50, 62.5 m core) Supported wavelengths ( nm) Maximum optical bandwidth 12 GHz Optical Reference Receivers All 125 Mb/s through 11.3 Gb/s standards Buffered electrical data pick-off to support external clock recovery» Recommended clock recovery, Tektronix CR175A or CR125A 80C12B Module with available ER-Calibrated for accurate repeatable ER measurements Accuracy: ±1.2% ( 0.76 db /+0.92 db at 12dB) Repeatability: ±0.6% ( 0.39 db / db at 12 db) Three configuration strategies available: 1. Any 4 Trib. rate filters, options F0 through F12 2. All 10 G rates only (8.5 Gb/s to 11.3 Gb/s filters only), Opt. 10G only 3. Select any 3 Trib rate filters, plus 10GP (10G rates) Filter Opt. F0 F1 F2 F3 F4 F5 F6 F7 F8 F9 F10 F11 F12 10G 10GP Rate(s) Supported Unfiltered 12 GHz bandwidth and ORR filter Mb/s Optical Reference Receiver (ORR) Filter 622 Mb/s ORR Filter Gb/s ORR Filter Gb/s ORR Filter Gb/s ORR Filter 2.488, Gb/s ORR Filter Gb/s ORR Filter 3.125, Gb/s ORR Filters Gb/s ORR Filter Gb/s ORR Filter Gb/s ORR Filter Gb/s ORR Filter 8.500, 9.95, 10.31, 10.51, 10.66, 10.71, 11.1, 11.3 Gb/s ORR Filters plus Unfiltered full bandwidth path (typically 12 GHz) 8.500, 9.95, 10.31, 10.51, 10.66, 10.71, 11.1, 11.3 Gb/s ORR Filters plus Unfiltered full bandwidth path (typically 12 GHz) specify 3 additional filter options (F1-F12) to be included. 30 July 2012, v W

10GbE to100gbe Optical Compliance Testing DSA8300 ALL-IN-ONE Solution Tektronix DSA8300 All-In-One System + 80C12B Optical Module (155 Mb/s to 11.

5Gb/s Highest repeatability & best sensitivity SMF and MMF support to 12G Up to 3x throughput over alternative 425 fs RMS native jitter 100 fs RMS jitter when

47 10GbE to100gbe Optical Compliance Testing DSA8300 ALL-IN-ONE Solution Tektronix DSA8300 All-In-One System + 80C12B Optical Module (155 Mb/s to 11.3 Gb/s) + 80C10C-F1 Optical Module (25.7 Gb/s to 44.5 Gb/s) The Only ALL-IN-ONE Solution with: All major ORRs from 155 Mb/s thru 44.5Gb/s Highest repeatability & best sensitivity SMF and MMF support to 12G Up to 3x throughput over alternative 425 fs RMS native jitter 100 fs RMS jitter when equipped with 82A04B Tektronix CR to 28.6 Gb/s, third party to 44.5 Gb/s Integrated clock recovery trigger pickoff Calibrated Extinction-Ratio (ER) Measurements 1 30 July 2012, v W

DSA8300 Digital Serial Analyzer TDR and Electrical Module Portfolio TDR / Electrical Modules Electrical TDR Modules Channels Vertical Resolution Bandwidth TDR System Incident Rise Time (10%-90%) TDR

48 DSA8300 Digital Serial Analyzer TDR and Electrical Module Portfolio TDR / Electrical Modules Electrical TDR Modules Channels Vertical Resolution Bandwidth TDR System Incident Rise Time (10%-90%) TDR System Reflected Rise Time (10%-90%) 80E bits 20 GHz 23 ps 28 ps 80E bits 30 GHz 18 ps 20 ps 80E bits 50 GHz 12 ps 15 ps Electrical Module Electrical Modules Channels Vertical Resolution Bandwidth Risetime (10%-90%) Monolithic or Remote 80E bits 50 GHz 7 ps Monolithic 80E bits 20 GHz 17.5 ps Monolithic 80E bits 70+ GHz 5 ps Monolithic 80E bits 30 GHz 11.7 ps Remote (2 meter) 80E bits 60 GHz 5.8 ps Remote (2 meter) 51

BERT Portfolio Lineup BERTScope (BSA) Clock Recovery (CR) Main

Communications Jitter measurement New Product Launch Pre-Emphasis

signal pre-emphasis requirements. BitAlyzer Basic BERT & Scope 28.

49 BERT Portfolio Lineup BERTScope (BSA) Clock Recovery (CR) Main product Used with BERTs & BERT & Scope Scopes Serial & Communications Jitter measurement New Product Launch Pre-Emphasis (DPP) Add-on to BERTScope Generator to model Standards specific signal pre-emphasis requirements. BitAlyzer Basic BERT & Scope 28.6G 26G 17.5G 12.5G 8.5G 28.6G 17.5G 12.5G 12.5G 1.5G/1.6G 9/ W

What is a BERTScope? A Combination BERT and Scope for Computer Bus and Communications Serial Data Applications 1 Pattern Generator (with optional Stress) sends bits, e.g.

50 What is a BERTScope? A Combination BERT and Scope for Computer Bus and Communications Serial Data Applications 1 Pattern Generator (with optional Stress) sends bits, e.g. a PRBS pattern A Typical Receiver Test Setup From Stressed Pattern Generator loopback To Error Detector Device Under Test (DUT) 3 BER measurements also used for scope-like analysis 2 Bits come back from DUT to Error Detector and compared to expected pattern for Bit Error Ratio (BER) measurement.

51 1. Stressed Receiver Tolerance Testing Start Testing Quickly 1 2 From Stressed Pattern Generator 3 loopback 4 To Error Detector Device Under Test (DUT) 1. Recall stressed eye configuration 2. Apply stressed eye signal to DUT s receiver 3. DUT loops received bits back to BERTScope Error Detector 4. BERTScope counts any errors

52 2. Creating the Stressed Signal Dynamically change Data Rate, Stress, Pattern Gb/s PRBS-7 DJ: SJ: RJ: SI: Gb/s PRBS-7 DJ: SJ: RJ: SI: Gb/s PRBS-7 DJ: SJ: RJ: SI:

New Product Description BERTScope BSA286C BSA286C High performance BERTScope, offers unique performance and jitter specifications required by the emerging and diverse high speed (100Gbps) COMMS

53 New Product Description BERTScope BSA286C BSA286C High performance BERTScope, offers unique performance and jitter specifications required by the emerging and diverse high speed (100Gbps) COMMS market. Key features: Gbps spec d performance, with non-calibrated performance to 29G. Sub 300fSec Rj Tx noise floor, essential and a unique differentiator for the performance COMMS market. This puts the BSA into one of the lowest jitter BERT s in the market. New MFG Calibration process to guarantee low jitter PG properties and better unit to unit consistency. The only system on the market with continuous (no hole) coverage from 1Gbps to 29.0Gbps. Unmatched versatility and ease of use. Optional full rate error detection (28GED) without the use of external de-mux systems. Support for 32G Fibre Channel, 802.3ba (100GE) and ITU-709 standards Tektronix is now offering a new category of low intrinsic jitter capabilities and versatile debug and measurement capabilities 56

54 Electrical Signal Properties at 28G 10GBASE-CR4 and 10GBASE-CR10 Interference Tolerance Parameters 9/ W

55 10/100G TX/RX optical testing Solutions Tektronix has answers for 100G DSA8300 Sampling Oscilloscope >80GHz Bandwidth <100 fsec jitter noise Pass/Fail at high throughput BUJ-Based Jitter Analysis BSA286C Bit Error Rate Tester 28.6 Gb/sec Data Rate Low intrinsic jitter Stressed, calibrated PRBS31 patterns Error location & Jitter Analysis OM4000 Coherent Lightwave Analyzer DP-QPSK Analysis Constellation Mapping to BER Works with RT or ET Scopes October

AEO GEPON ONU PHY OE EO CDR / SerDes 10Gb/s 1310nm DFB 1550nm EA-DFB TOSA Fiber Fiber Laser Driver Circuit Pre-Amp. Post-Amp. Optical Transceiver Cloc

AEO GEPON ONU PHY OE EO CDR / SerDes 10Gb/s 1310nm DFB 1550nm EA-DFB TOSA Fiber Fiber Laser Driver Circuit Pre-Amp. Post-Amp. Optical Transceiver Clock Synthesis, Mux Pulse Recovery, DeMux TOSA ROSA TOSA/ROSA